《電子測(cè)試雜志》是唯一專門(mén)從事電子測(cè)試的雜志，它是一個(gè)國(guó)際論壇，傳播該領(lǐng)域的最新研究成果和應(yīng)用。隨著期刊迅速進(jìn)入出版周期，它迅速地將重要的發(fā)現(xiàn)引起了研究者和實(shí)踐者的注意。期刊所涵蓋的部分主題包括：VLSI器件、印刷電路板和電子系統(tǒng)的測(cè)試；故障建模和模擬；測(cè)試生成；可測(cè)試性設(shè)計(jì)；電子束測(cè)試系統(tǒng)；硬件的正式驗(yàn)證；驗(yàn)證模擬；設(shè)計(jì)調(diào)試；測(cè)試經(jīng)濟(jì)性；質(zhì)量和可靠性和CAD工具。除了最初的研究論文外，該雜志還發(fā)表了具有卓越功績(jī)的會(huì)議論文。讀者還可以找到調(diào)查和評(píng)論，研究該領(lǐng)域的最新技術(shù)。

The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.A partial list of topics covered in the journal includes: testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.